ACCESS NC-A Probes - Standard Non-Contact/Tapping Mode probe, aluminum coated on reflex side
AppNano ACCESS-NC-A probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. The reflex side is coated with aluminum.
Tip Specifications
- Material: Silicon
- Shape: Triangular Pyramid
- Height (µm): 14-16
- Coating: none
- ROC (nm): 10
Cantilever Specifications
- Material: Silicon
- Shape: Rectangular
- Reflex coating: Al, 50 nm ± 5 nm
- Alignment Grooves: YES L x W x T: 3.4 mm x 1.6 mm x 315 µm
| Parameter | Nominal Value | Minimum Value | Maximum Value |
|---|---|---|---|
| Spring Constant (N/m) | 78 | 32 | 169 |
| Frequency (kHz) | 300 | 200 | 400 |
| Length (µm) | 150 | 130 | 170 |
| Width (µm) | 54 | 52 | 56 |
| Thickness (µm) | 5.2 | 4.2 | 6.2 |