P100/P150 Atomic Force Microscope

Overview

With a sub-nanometer Z resolution, the P100/P150 can be used for high resolution imaging and measurement. The integrated low-noise and open-loop scanner allows for quick and effective experiments up to 15 μm by 15 μm. Our unique astigmatic optical design produces a small 0.56 μm laser spot size, allowing users to experiment with smaller and faster AFM cantilevers.

Included with the P100/P150 is our highly intuitive PSX control software, which allows the user to complete experiments with minimal training. Our One-click Scan feature automates the setup and scan process, allowing users to quickly obtain high quality scan results. The built-in scan library management feature simplifies the flagging of scan data and allows the user easily delete or export scans.

For application papers, quick notes, and videos, click HERE.

Download the P100 English brochure

Key Features

• 0.12 nm Z Spatial Resolution

• 0.56 μm Laser Spot Size

• 15 μm x 15 μm Open-Loop Scan Range

• Perpetually Aligned Optical Design - Laser and detector require no alignment

• Fast Setup - Out of the box, the system takes only minutes to set up and begin the first scan.

• Multilingual Software (English/Chinese/Japanese/Korean/Spanish/German)

• One-click Scan - Automatically tune, approach the surface, calibrate the force curve, and scan the sample in a single click enabled by smart predictive algorithms

• Simple Probe Loading

Patterned Sapphire Substrate

Graphene

Thin Film

Silicon Wafer

HOPG

TGQ1